NEWS » Release of the Variable-Pressure Scanning Electron Microscope, FlexSEM 1000

Release of the Variable-Pressure Scanning Electron Microscope, FlexSEM 1000

25 October 2016
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SCHAUMBURG, Illinois– Hitachi High Technologies America, Inc. has announced the release of a new scanning electron microscope (SEM), Model FlexSEM 1000, in the Americas, making it now available worldwide. The FlexSEM 1000 has been developed as a compact SEM system with a minimized, lab-friendly footprint, while offering the resolution equal to that of conventional, full-sized SEM models’, as well as superior ease of use for users of all levels.

Compact Variable-Pressure SEM FlexSEM 1000 (Main unit and Power Supply unit are separable)

Compact Variable-Pressure SEM FlexSEM 1000
(Main unit and Power Supply unit are separable)

SEMs support high-magnification and high-resolution analyses of elements and are utilized for observation of the surface structures of materials for R&D, quality assurance and other many purposes in various industrial fields such as nanotechnology and biotechnology fields. In recent years, the demand for fine surface structure observation has increased and expanded the usage of SEMs to production sites, inspection sites, and offices. This in turn has created a need for a compact instrument which fits in a limited space.

The Main unit of the newly released FlexSEM 1000 has dimensions of 450 mm(W) x 640 mm(D), and is 52% more compact, 45% lighter, and 50% more energy-efficient than the existing model, the SU1510. Also, it only requires a standard wall outlet for power (AC100V 3P). The Main unit can be separated from the Power Supply unit for additional space-saving and flexible system placement.

The FlexSEM 1000 has achieved 4-nm resolution by employing a newly designed electrical optical system and a high-sensitivity detector, normally used in high-end models with proven reliability.


The user interface is easy to operate even by novice users, and with the various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience levels. Specifically, the new and enhanced navigation function, SEM MAP, helps locate the regions of interest quickly, and delivers accurate correlated optical and SEM images with only one click.

Main Features

  1. Compact design (45 cm wide) with 4 nm resolution
  2. Intuitive user interface enables high-quality, high-throughput imaging regardless of user experience level
  3. Novel navigation function, SEM MAP, for searching an entire field of view and locating regions of interest
  4. Large Area (30mm²) Silicon Drift Detector EDS System for high speed data acquisition
  5. Through speeding up automated brightness and focus functions, wait time becomes 1/3 shorter comparing to the conventional products

 

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